Secondary keywords

use of for certain input parameters.................... 2‑2, 2‑7

Settling and removal

MASSFRAX keyword........................................... 3‑46

PARTDENS keyword........................................... 3‑46

PARTDIAM keyword........................................... 3‑46

specifying input parameters for............................ 3‑46

SO pathway.................................................. 2‑2

brief tutorial............................................. 2‑16

example of inputs for...................................... 2‑17

keyword reference..................................... 3‑21, B‑7

Source code

portability to other systems.............................. 3‑127

Source contribution analyses............................... 1‑13

use of the EVENT model for................................. 1‑14

use of the SOCONT option for ISCLT........................ 3‑112

Source groups.............................................. 3‑51

limits on number of......................................... 2‑9

specifying a group of ALL sources.......................... 3‑51

SRCGROUP keyword................................. 3‑51, A‑5, B‑7

Source IDs

specifying alphanumeric.................................... 3‑23

Source ranges

specifying and interpreting................................ 3‑36

Sources.. 3‑21

limits on number of......................................... 2‑9

specifying source location inputs.......................... 3‑22

specifying source parameter inputs................... 3‑21, 3‑24

Stack parameters

see Point sources.......................................... 3‑24

Stack‑tip downwash

and the regulatory default option...................... 2‑7, 3‑6

NOSTD parameter............................................. 3‑5

specifying not to use on MODELOPT card................. 3‑5, B‑4

STAR frequency files........................................ F‑5

specifying contents of the STAR file................. 3‑12, 3‑76

Storage limits.............................................. 2‑8

modifying the storage limits................................ 4‑6

Surface roughness length................................... 3‑87

 

 

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